GM200/300 is low cost tool designed to detect metal residue post CMP. The tool can use as standalone or integrated.

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The TIM200/300S is low cost tool designed to detect macro defects on both sides of the wafer and on the rim as well. The defects detected could be such as scratches, particles, etc.

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Tyto200/300s is standalone tool drive from the AMI tool. Its Low cost. Designed to detect defects after he final process. Following the test the tool is able to assemble the wafers automatically in to the jar.

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About May

May Hi-Tech Solutions Ltd.

Develops and produces unique, competitively priced, automatic optical inspection tools for semiconductor fabrication plants. Its tools are already proving their effectiveness at leading FABs all over the world.

The unique operational concepts upon which the tools are based result in a low cost of ownership, high reliability, high throughput, and enhanced  performance, in terms of both accuracy and the types of defects they are able to detect.



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